Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Mohammed Ismail, Sleiman Bou-Sleiman
Naturwissenschaften, Medizin, Informatik, Technik / Elektronik, Elektrotechnik, Nachrichtentechnik
Beschreibung
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Kundenbewertungen
Built-in-Self-Calibration, Low Noise Amplifiers, Embedded Systems, Testing Integrated Circuits, LTE 4G, Analog Circuits and Signal Processing, RF and Millimeter Wave Integrated Circuits, Nanometer Wireless Radio, WIMAX, Built-in-Self-Test